grabowski 808e3e34b8 Add quality automation spec: stamper metrology and layered record QC ...

- Keyence-class instrument stack for father/mother/stamper analysis
  (VK-X confocal sampled zones, VR-6000 wide-area, XRF thickness) with
  genealogy integration via middleware
- Three-layer pressed-record QC: 100% inline optical inspection,
  per-cycle press telemetry, sampled automated audio comparison
- Honest limits documented: no turnkey products exist for the optical
  and audio layers; 100% audio QC impossible at press speed

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..

consulting

Initial commit: planning documents

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equipment

Split README into topic documents

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finance

Initial commit: planning documents

2026-07-17 11:47:47 +07:00

suppliers

Add whole-factory HVAC requirement and process traceability spec

2026-07-17 13:05:46 +07:00

facility-layout.drawio

Add factory layout concept diagram and fix fire-suppression section structure

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facility-layout.pdf

Add factory layout concept diagram and fix fire-suppression section structure

2026-07-17 13:41:23 +07:00

facility-layout.png

Add factory layout concept diagram and fix fire-suppression section structure

2026-07-17 13:41:23 +07:00

facility-security.md

Add factory layout concept diagram and fix fire-suppression section structure

2026-07-17 13:41:23 +07:00

quality-automation.md

Add quality automation spec: stamper metrology and layered record QC

2026-07-17 13:56:45 +07:00

sustainability.md

Add whole-factory HVAC requirement and process traceability spec

2026-07-17 13:05:46 +07:00

traceability.md

Add quality automation spec: stamper metrology and layered record QC

2026-07-17 13:56:45 +07:00

worker-safety.md

Split README into topic documents

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