Commit Graph
2 Commits
Author SHA1 Message Date
grabowski 808e3e34b8 Add quality automation spec: stamper metrology and layered record QC
- Keyence-class instrument stack for father/mother/stamper analysis
  (VK-X confocal sampled zones, VR-6000 wide-area, XRF thickness) with
  genealogy integration via middleware
- Three-layer pressed-record QC: 100% inline optical inspection,
  per-cycle press telemetry, sampled automated audio comparison
- Honest limits documented: no turnkey products exist for the optical
  and audio layers; 100% audio QC impossible at press speed
2026-07-17 13:56:45 +07:00
grabowski 0b79c4fb73 Add whole-factory HVAC requirement and process traceability spec
- facility-security.md: continuous temperature/humidity/PM control, zoned
  filtration, burning-season PM2.5 design point, HVAC in PV/battery sizing
- traceability.md: end-to-end per-order customer traceability, batch
  genealogy, log-at-source principles, machine data access as a
  procurement requirement
2026-07-17 13:05:46 +07:00