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README: 1D traces now show |J|; teardrops included; AC |J| reference

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Follow the swarm-review fixes: chain cells display the true in-trace
current density, teardrop zones conduct, and AC current-density maps
are referenced to the skin-reduced equivalent thickness.
This commit is contained in:
Alexander Grabowski
2026-07-15 19:47:04 +07:00
parent 0afb55216b
commit cfe6c72f3b
1 changed files with 10 additions and 6 deletions
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README.md
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@@ -2,9 +2,9 @@
Computes the **DC or AC resistance of copper zone fills and traces** Computes the **DC or AC resistance of copper zone fills and traces**
between two contacts, **single- or multi-layer**: the chosen net's fills between two contacts, **single- or multi-layer**: the chosen net's fills
and tracks on the selected copper layers are solved as coupled (teardrops included) and tracks on the selected copper layers are
finite-difference sheets linked by the net's **via and through-hole-pad solved as coupled finite-difference sheets linked by the net's **via
barrels** (18 µm plating, configurable). At a user-set **frequency** the exact 1D foil/barrel and through-hole-pad barrels** (18 µm plating, configurable). At a user-set **frequency** the exact 1D foil/barrel
skin-effect correction is applied (AC results are a rigorous lower skin-effect correction is applied (AC results are a rigorous lower
bound — see *Model & limits*). Shows per-layer rasterized maps, bound — see *Model & limits*). Shows per-layer rasterized maps,
potential, current density, and **power density**, reports **per-via potential, current density, and **power density**, reports **per-via
@@ -96,8 +96,9 @@ SWIG API. Requires KiCad **10.0.1+**.
`TRACK_1D_FACTOR` (3) grid cells are modeled as exact **1D resistor `TRACK_1D_FACTOR` (3) grid cells are modeled as exact **1D resistor
chains** along their centerline — true arc length per link, so their chains** along their centerline — true arc length per link, so their
series resistance carries no discretization error and no cell-size series resistance carries no discretization error and no cell-size
tuning is needed for thin traces. 1D-modeled traces show potential and tuning is needed for thin traces. 1D-modeled traces show potential,
power density but no |J| field. Pad copper other than the selected power density, and |J| (the true in-trace density from the link
currents, |ΔV|/(ρ·Δl)). Pad copper other than the selected
contacts is still **not** part of the conductor model. contacts is still **not** part of the conductor model.
- **Solder buildup on mask openings** (dialog checkbox, **off by - **Solder buildup on mask openings** (dialog checkbox, **off by
default**; `INCLUDE_MASK_BUILDUP`): zones drawn on `F.Mask`/`B.Mask` default**; `INCLUDE_MASK_BUILDUP`): zones drawn on `F.Mask`/`B.Mask`
@@ -131,7 +132,10 @@ SWIG API. Requires KiCad **10.0.1+**.
and is not captured — since the resistance-driven distribution is the and is not captured — since the resistance-driven distribution is the
minimum-dissipation one, AC results are a rigorous **lower bound**. minimum-dissipation one, AC results are a rigorous **lower bound**.
Rule of thumb for 70 µm foil: skin is negligible below ~300 kHz Rule of thumb for 70 µm foil: skin is negligible below ~300 kHz
(δ = 173 µm at 142 kHz), ~+11 % at 1 MHz. (δ = 173 µm at 142 kHz), ~+11 % at 1 MHz. At f > 0 the |J| maps are
referenced to the skin-reduced conduction-equivalent thickness
t/(R_AC/R_DC) — the density in the copper that actually conducts —
not the geometric foil thickness.
- 5-point FDM per layer on an auto-sized shared grid (~2 M fine cells - 5-point FDM per layer on an auto-sized shared grid (~2 M fine cells
with the uniform grid; ~8 M with the adaptive grid, whose unknown with the uniform grid; ~8 M with the adaptive grid, whose unknown
count no longer scales with them). Direct sparse solve up to 500 k count no longer scales with them). Direct sparse solve up to 500 k