 grabowski
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808e3e34b8
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Add quality automation spec: stamper metrology and layered record QC
- Keyence-class instrument stack for father/mother/stamper analysis
(VK-X confocal sampled zones, VR-6000 wide-area, XRF thickness) with
genealogy integration via middleware
- Three-layer pressed-record QC: 100% inline optical inspection,
per-cycle press telemetry, sampled automated audio comparison
- Honest limits documented: no turnkey products exist for the optical
and audio layers; 100% audio QC impossible at press speed
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2026-07-17 13:56:45 +07:00 |
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