Add quality automation spec: stamper metrology and layered record QC

- Keyence-class instrument stack for father/mother/stamper analysis
  (VK-X confocal sampled zones, VR-6000 wide-area, XRF thickness) with
  genealogy integration via middleware
- Three-layer pressed-record QC: 100% inline optical inspection,
  per-cycle press telemetry, sampled automated audio comparison
- Honest limits documented: no turnkey products exist for the optical
  and audio layers; 100% audio QC impossible at press speed

README.md

@@ -74,6 +74,10 @@ The detail lives in dedicated documents:
 - [Process logging and traceability](docs/traceability.md): end-to-end
   per-order traceability for customers, batch genealogy from audio file to
   shipment, and the requirements this sets for the factory software
+- [Quality automation](docs/quality-automation.md): stamper metrology
+  (Keyence-class confocal, profiler, XRF), layered pressed-record QC (100%
+  optical inspection, per-cycle press telemetry, sampled automated audio
+  comparison), and how it feeds traceability
 
 ## Repository Layout
 
@@ -87,6 +91,7 @@ docs/
 ├── finance/               Project cost overviews
 ├── suppliers/             Supplier contacts, vendor landscape, supplier map
 ├── facility-security.md   Security, HVAC, fire and life safety, compliance
+├── quality-automation.md  Stamper metrology and layered record QC
 ├── sustainability.md      Energy, water, materials commitments
 ├── traceability.md        Process logging and per-order traceability
 └── worker-safety.md       Training, clean rooms, PPE